The new Vanta Element X-ray fluorescence (XRF) analyser offers the essential features that the Vanta series is known for in a cost-effective model.
Easy to learn, fast to use and weighing a slim 1.32kg, the Vanta Element analyser is up to the challenge of all day, high-throughput testing.
It offers speed and ease of use in a variety of testing environments, including scrap recycling and metal manufacturing. Users can obtain clear material and grade ID in seconds and compare alloy grades on the instrument’s screen.
With a dual-core processor and powered by Olympus’ proven Axon Technology, the Vanta Element analyser has the same stability and resolution as the rest of the Vanta series for rapid sorting and a fast ROI.
Built for use in demanding environments, Vanta Element analyzers are IP54 rated for resistance to dust and moisture and constructed to pass a 4-foot drop test (MIL-STD-810G) to help keep you working in case of an accidental drop or impact.
For additional protection, a stainless steel faceplate is paired with a thick (50 µm) Kapton window that can be easily attached and removed for toolless window changes in the field. If you work in hot or cold environments, you can count on the Vanta Element analyzer to perform continuously in temperatures from -10 °C to 45 °C.
The analyser’s ruggedness features are paired with optional wireless connectivity—connect to the Olympus Scientific Cloud for wireless data sharing and access to convenient fleet management tools, the Olympus mobile app or your network, helping future proof it for Industry 4.0.
The analyser also has an industrial 1 GB microSD card for storing results and two USB ports for easy data export. For added flexibility, it is compatible with accessories including the Vanta field stand, soil foot, probe shield and holster.